WANG Ren,SUN Haoran,JING Shouzhao,et al.A RF Circuit Design for Non-destructive Testing of Dielectric Properties of Materials[J].Journal of Chengdu University of Information Technology,2023,38(05):503-506.[doi:10.16836/j.cnki.jcuit.2023.05.002]
一种用于材料介电特性无损检测电路设计
- Title:
- A RF Circuit Design for Non-destructive Testing of Dielectric Properties of Materials
- 文章编号:
- 2096-1618(2023)05-0503-04
- 分类号:
- TN923
- 文献标志码:
- A
- 摘要:
- 随着微波技术的高速发展，基于微波技术的材料介电特性无损检测被广泛应用于复合材料、食品工程和细胞活性检测等领域。提出一种基于共面波导结构(CPW)的对称型材料介电特性检测电路，该微波电路工作于S波段，主要包含二等分功率分配/合路器及多根交指电容(IDC)，通过对称结构和多根交指电容互耦建立待检测材料与电磁波强相互作用区域，基于该电路设计了材料介电特性无损检测实验系统。实验测量与仿真结果非常吻合，证明该检测装置的可靠性。最后，实验测量了常用固态材料如 Teflon、Plexiglas、PVC和干燥原木等的电路散射参数响应情况，证明该无损检测电路的高灵敏度和可靠性。
- Abstract:
- With the rapid development of microwave technology, non-destructive testing(NDT)of dielectric properties of materials based on microwave technology has been widely applied in the fields of compliance materials, food engineering and cell activity testing. This paper proposes symmetrical RF circuit based on coplanar waveguide structure. The microwave circuit works in the S-band and mainly includes two-half power distribution/synthesis branches and multiple interdigitated capacitive mutual couplings. The experimental measurements are consistent with the simulation results, proving the reliability of the detection device. Finally, the complex dielectric constants of common solid materials such as Teflon, Plexiglas and PVC are measured experimentally, and the comparison with the existing experimental data proves the measurement accuracy and reliability of the nondestructive testing circuit.
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备注/Memo
收稿日期:2022-09-10
基金项目:国家自然科学基金资助项目(62001402); 广东省重点领域研发计划资助项目(2020B0101080001)